KLA-Tencor Corporation engages in design, manufacture, and marketing of process control and yield management solutions for the semiconductor and related nanoelectronics industries worldwide. It provides a portfolio of defect inspection and metrology products, as well as related service, software, and other offerings. The company offers inline wafer and integrated circuit (IC) defect monitoring, review, and classification; reticle defect inspection and metrology; packaging and interconnect inspection; critical dimension metrology; pattern overlay metrology; film thickness, surface topography, and composition measurements; measurement of in-chamber process conditions, wafer shape, and stress metrology; computational lithography tools; and yield and fab-wide data management and analysis systems. KLA-Tencor Corporation offers its products and services for bare wafer, IC, lithography reticle, and disk manufacturers. It also serves light emitting diode and data storage industries, as well as general materials research industries. KLA-Tencor Corporation was founded in 1975 and is headquartered in Milpitas, California.