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    Probe Card Stocks List

    Symbol Grade Name % Change
    INTT C inTest Corporation -0.13
    FORM F FormFactor, Inc. 1.67
    AEHR F Aehr Test Systems 2.31
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    Related Industries: Semiconductor Equipment & Materials Semiconductors
    Related Stock Lists: Semiconductor Semiconductor Device Fabrication Semiconductor Manufacturers Integrated Circuits Wafer Wafer Testing Automatic Test Equipment Automatic Testing Equipment Burn In Systems Card Products Computer Data Computer Memory DDR3 SDRAM Dynamic Random Access Memory Electrical Engineering Electrical Products Electronic Components Electronic Engineering Electronics Electronics Manufacturers

    Related ETFs - A few ETFs which own one or more of the above listed Probe Card stocks.

    Symbol Grade Name Weight
    PSI F PowerShares Dynamic Semiconductors 2.15
    PSCT B PowerShares S&P SmallCap Information Technology Portfolio 1.92
    QTUM A Defiance Quantum ETF 1.0
    SMCP B AlphaMark Actively Managed Small Cap ETF 0.79
    VIOG B Vanguard S&P Small-Cap 600 Growth ETF 0.52
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    Compare PSCT to QTUM Compare PSCT to SMCP Compare PSI to VIOG

        Probe Card Stocks Recent News

        Date Stock Title
        Nov 21 AEHR Undiscovered Gems In The US Featuring Three Promising Small Caps
        Nov 19 AEHR Are Options Traders Betting on a Big Move in Aehr Test Systems (AEHR) Stock?
        Related Industries: Semiconductor Equipment & Materials Semiconductors
        Related Stock Lists: Semiconductor Semiconductor Device Fabrication Semiconductor Manufacturers Integrated Circuits Wafer Wafer Testing Automatic Test Equipment Automatic Testing Equipment Burn In Systems Card Products Computer Data Computer Memory DDR3 SDRAM Dynamic Random Access Memory Electrical Engineering Electrical Products Electronic Components Electronic Engineering Electronics Electronics Manufacturers
        Probe Card

        A probe card is a device used to make electrical contact with the terminals of an integrated circuit (IC) or other small electronic device for the purpose of testing it. It is typically used in automated test equipment (ATE) to test the functionality of the IC. The probe card typically contains a number of probes, which are spring-loaded pins that make contact with the IC's terminals. The probe card also contains circuitry to route the signals from the IC to the ATE.

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